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Test Solution

Test Solution

Test Solution Providers

GMTEST offers comprehensive testing solutions to expedite the design, mass production, market entry, and testing phases of your product. We specialize in creating test programs for a wide array of system semiconductors, including SoC, logic, analog, and mixed-signal products, leveraging our expertise in developing test programs for fabless semiconductor products to serve a diverse range of domestic and international clients.

Test program development and product characterization

Our Test Development and Technical Services team stands out in the testing field for its groundbreaking research and unparalleled test engineering capabilities. GMTEST's early product design interventions ensure our clients enjoy a swift market entry and cost-efficient solutions, with capabilities extending from -40°C to 115°C temperature testing and accommodating wafer sizes from 6 inches to 12 inches.

Offer cutting-edge research and testing engineering capabilities

Advantages of accelerated market entry and affordable solutions

Capability for temperature testing from -40°C to 115°C and wafer testing from 6 inches to 12 inches

Available services include
1. Test Specification Validation
2. Developing Test Programs
3. Product Characteristics Analysis
4. Analyzing the Relationship between Product and Test
5. Program release
6. Optimizing Test Programs for Cost Efficiency
7. Developing the most concise test program to accelerate market entry.
...
These services apply across a broad spectrum of test applications, including
Logic, Digital & Mixed Signal
Radio Frequency (RF)
Liquid Crystal Display (LCD) Drivers
Microelectromechanical Systems (MEMS)

Test Vector Platform Transformation

GMTEST's testing infrastructure supports a range of test formats, including VCD, WGL, and STIL. Through our advanced tools and testing methodologies, GMTEST efficiently transforms various testing modes to fit the chosen testing platforms.
We offer the following services

1.
Synthesis of Test Patterns
2.
Conversion to Selected Test Platform
Test Mode Transformation

Test Hardware Design and Fabrication

We deliver tailor-made design solutions for probe cards, load boards, and additional accessories tailored to customer specifications. GMTEST offers a comprehensive maintenance program for all serviceable components, ensuring full management of accessories.

  • 1.
    Mechanical and Electrical Design Layout
  • 2.
    Custom Probe Card Design and Manufacture
  • 3.
    Load Board Design and Construction
  • 4.
    Socket Design and Manufacture

Remote Service and Test Data Handling

  • 1. Remote Access

    Enables clients to remotely access the tester workstation for debugging, repairs, and uploads.

  • 2. FTP (Automated File Transfer Protocol) and Data Server Management

    Test data are regularly transmitted in FTP format. Clients have the capability to access GMTEST’s Data Server directly using assigned user name and password for downloading test data.

  • 3. Analysis of Test Data and Yields

    GMTEST utilizes three strategies for monitoring the testing procedure.

  • 3.1. Traditional T-Card System

    Utilizing customer-defined yield criteria to inspect items and document the observations on T-cards manually.

  • 3.2. Online Process Monitoring System (MES)

    Conducts automatic monitoring of test yields, special bin control (SBL), and disparities in test data. It alerts the operator about detected issues and provides procedural steps for resolution.

  • 3.3.Test Data Management System (QMS)

    As GMTEST’s premier system for managing test data, it facilitates yield monitoring, data transfer, and satisfies all additional demands according to customer specifications.

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31043 48 Seonggeosandan 1-ro, Seonggeo-eup, Seobuk-gu, Cheonan-si, Chungcheongnam-doTel. +82 41 410 2600